New method of crystal material heterogeneity examination

Abstract

A principally new method of phase heterogeneity examination based on diffractometric analysis of interference maximum integral intensity of X-ray beam reflections from microvolumes of dif­ferent sizes in irradiated samples of crystal materials has been developed. Also, some quantitative relationships have been experimentally tested and theoretically justified, namely the dependence of X-ray line integral intensity on the structure of incident radiation, the size of beam projection on the surface of a sample and other survey parameters. Newly developed diffractometric survey of interference line profiles allows to reach an effective averaging in texture heterogeneities that is important for high accuracy and reliable determination of quantitative values of integral intensity. Basing on the above quantitative dependences, necessary relationships have been established to find the values of relative differences between concentrations. New method is advantageous in phase heterogeneity and crystal material porosity analysis as well as in the analysis of the efficiency of blending in multi-phase powder mixtures.