METHOD FOR EXPANDING THE OBJECT BASE OF EXAMINATION BY STITCHING SOLUTIONS OF HIERARCHY ANALYSIS METHOD
DOI:
https://doi.org/10.14529/mmp170206Keywords:
hierarchy analysis method, optoelectronic detectors, quality indexAbstract
The paper presents the results on numerical modelling of the quality of opto-electronic detectors. In order to demonstrate a successful application of the proposed method of the object base extension, we use examples of hierarchy analysis of generalized quality index and integrated quality-price index. The proposed methodology allows reliable analysis the number of objects up to 21-24, that is enough for the most practical cases of examination
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